MPI Corporation has Installed its WaferWallet(R)MAX for 200mm and 300mm WLR Processes

MPI Corporation’s Advanced Semiconductor Test Division, an industry and innovation leader of semiconductor test solutions initiated the integration of the TS3500-SE automated wafer probe test system with WaferWallet®MAX, a multi-purpose cassette, FOUP self-docking 200 mm and 300 mm handling solution, into a leading WLR test process. The WaferWallet®MAX provides an automation solution by increasing overall testing time […]